• DocumentCode
    42549
  • Title

    A Compiler Design Technique for Impulsive VDD Current Minimization

  • Author

    Shih-Yi Yuan ; Wei-Bing Su ; Guo-Kai Ni ; Ting-Yun Chi ; Sy-Yen Kuo

  • Author_Institution
    Dept. of Commun. Eng., Fang Chia Univ., Taichung, Taiwan
  • Volume
    55
  • Issue
    5
  • fYear
    2013
  • fDate
    Oct. 2013
  • Firstpage
    855
  • Lastpage
    866
  • Abstract
    For electromagnet interference (EMI) optimization issues, different hardware-level techniques have been proposed. This paper focuses on an EMI optimization technique via a software-level technique. We propose a novel estimation and optimization tool for reducing conducted EMI at specified frequency by compiler technology. This study is not a research on compiler technique but an adaption of computer science-domain technology to EMI optimization research. The proposed tool can accept C language syntax and generate many versions of assembly programs. These assembly programs perform the same functionality defined by the input C program but with different conducted EMI behaviors when they are executed. The proposed tool can estimate, select, and generate the assembly program with the least amount of conducted EMI released during its execution. The experiment results show that the proposed tool can analyze test C-programs and generate lower EMI assembly programs. Currently, compared to a commercial compiler, the proposed technique can decrease conducted EMI by 2-5 dB at any specified frequency.
  • Keywords
    C language; electromagnetic compatibility; electromagnetic interference; optimisation; optimising compilers; program assemblers; C language syntax; EMI behaviors; EMI optimization issues; assembly programs; compiler design technique; computer science-domain technology; conducted EMI; electromagnet interference; hardware-level techniques; impulsive VDD current minimization; software-level technique; Assembly; Databases; Electromagnetic interference; Generators; Grammar; Microcontrollers; Optimization; Electromagnetic analysis; electromagnetic interference (EMI); electromagnetic measurements;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2013.2240459
  • Filename
    6449312