• DocumentCode
    428943
  • Title

    Characterization of homogenous TM nonlinear waveguide sensors

  • Author

    Abadla, M.M. ; Shabat, M.M.

  • Author_Institution
    Dept. of Phys., Al-Aqsa Univ., Gaza, Palestinian Authority
  • Volume
    1
  • fYear
    2004
  • fDate
    4-6 Oct. 2004
  • Lastpage
    236
  • Abstract
    This work is devoted on a three-layer sensor bounded from one side by a nonlinear clad of intensity dependent refractive index. A normalized analysis of sensitivity of this configuration and the condition to maximize this sensitivity is introduced. Behavior of sensing sensitivity is accounted for through power flow and cut-off considerations. We establish a method of determining the proper dimensioning of the sensor to execute its maximum sensitivity. We found that the sensitivity is higher in nonlinear sensors than in linear case in spite of appearing at lower wave guiding widths so that nonlinear sensors are advisable in accurate sensing.
  • Keywords
    nonlinear optics; optical sensors; refractive index; sensitivity; terrain mapping; waveguides; TM sensors; intensity dependence; maximum sensitivity; nonlinear clad; nonlinear optics; nonlinear sensors; nonlinear waveguide sensors; optical sensors; power cut-off; power flow; refractive index; sensing sensitivity; sensitivity analysis; sensor dimensioning; three-layer sensor; waveguides; Electromagnetic waveguides; Equations; Nonlinear optics; Optical films; Optical refraction; Optical sensors; Optical signal processing; Optical surface waves; Optical waveguides; Sensor phenomena and characterization;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International
  • Print_ISBN
    0-7803-8499-7
  • Type

    conf

  • DOI
    10.1109/SMICND.2004.1402849
  • Filename
    1402849