• DocumentCode
    436448
  • Title

    Diagnosis of a manufacturing cell

  • Author

    Olmos, J. ; Cardenas, Carlos ; Garcia, D. ; Baeyens, E. ; de Miguel, L.J.

  • Author_Institution
    CARTIF, Spain
  • Volume
    18
  • fYear
    2004
  • fDate
    June 28 2004-July 1 2004
  • Firstpage
    455
  • Lastpage
    460
  • Abstract
    Diagnostic of systems are having more importance in the manufacturing process. There exist several frameworks for synthesis of supervisors and diagnosers for Discrete Event System (DES). We propose a benchmark manufacturing cell and Some experiences of designing diagnosers we carried out using the Ramage and Wonham framework for decentralized discrete event 5ystems. In this paper, we work with common problem in highly automated systems; to locate quickly in correct state (quick localization of cycle).
  • Keywords
    Delay; Discrete event systems; Event detection; Production systems; Robots; Sampling methods; Sensor systems; Virtual manufacturing; DES; Diagnoser; discrete event systems; event control; manufacturing cell; modeling; supervision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Automation Congress, 2004. Proceedings. World
  • Conference_Location
    Seville
  • Print_ISBN
    1-889335-21-5
  • Type

    conf

  • Filename
    1441083
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=436448