Effect of switching from high to low dose rate on linear bipolar technology radiation response

Author

Boch, J. ; Saigné, F. ; Schrimpf, R.D. ; Fleetwood, D.M. ; Ducret, S. ; Dusseau, L. ; David, J.P. ; Fesquet, J. ; Gasiot, J. ; Ecoffet, R.

fYear

2003

fDate

15-19 Sept. 2003

Firstpage

537

Lastpage

543

Keywords

Degradation; Ionizing radiation; Microelectronics; Noise measurement; Performance evaluation; Protons; Silicon; Space technology; Switches; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on

Conference_Location

Noordwijk, The Netherlands

ISSN

0379-6566

Print_ISBN

92-9092-846-8

Type

Filename

1442531

Link To Document