DocumentCode
436793
Title
Enhanced low dose rate sensitivity (ELDRS) observed in RADFET sensor
Author
Kim, S.J. ; Seon, J. ; Min, K.W. ; Shin, Y.H. ; Choe, W.
fYear
2003
fDate
15-19 Sept. 2003
Firstpage
669
Lastpage
671
Keywords
Annealing; Charge carrier processes; Electron traps; MOSFET circuits; Space missions; Telephony; Temperature sensors; Testing; Threshold voltage; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2003. RADECS 2003. Proceedings of the 7th European Conference on
Conference_Location
Noordwijk, The Netherlands
ISSN
0379-6566
Print_ISBN
92-9092-846-8
Type
conf
Filename
1442571
Link To Document