DocumentCode
437896
Title
Electronics packaging issues for future accelerators and experiments
Author
Larsen, R.S. ; Downing, R.W.
Author_Institution
Stanford Linear Accel. Center, USA
Volume
2
fYear
2004
fDate
16-22 Oct. 2004
Firstpage
1127
Abstract
Standard instrument modules for physics reached their zenith of industrial development from the early 1960s through late 1980s. Started by laboratory engineering groups in Europe and North America, modular electronic standards were successfully developed and commercialized. In the late 1980´s a major shift in large detector design toward custom chips mounted directly on detectors started a decline in the use of standard modules for data acquisition. With the loss of the detector module business, commercial support declined. Today the engineering communities supporting future accelerators and experiments face a new set of challenges that demand much more reliable system design. The dominant system metric is availability. We propose (1) that future accelerator and detector systems be evaluated against a design for availability (DFA) metric; (2) that modular design and standardization applied to all electronic and controls subsystems are key to high availability; and (3) that renewed laboratory-industry collaboration(s) could make an invaluable contribution to design and implementation.
Keywords
data acquisition; electronics packaging; modules; nuclear electronics; accelerator systems; availability metric; control subsystems; data acquisition modules; detector module business; detector systems; electronic subsystems; electronics packaging; large detector design; modular electronic standards; Availability; Detectors; Electron accelerators; Electronics packaging; Europe; Instruments; Laboratories; North America; Physics; Standards development;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2004 IEEE
ISSN
1082-3654
Print_ISBN
0-7803-8700-7
Electronic_ISBN
1082-3654
Type
conf
DOI
10.1109/NSSMIC.2004.1462401
Filename
1462401
Link To Document