Degradation testing and lifetime prediction of GMR heads under mechanically and thermally accelerated conditions

Head degradations of giant magneto-resistive (GMR) heads have been studied from the electrical and magnetic points. We experimentally and quantitatively investigated the output reduction under such conditions. Experimental results and lifetime prediction considering these conditions are presented. Accumulated mechanical acceleration caused gradual and continuous head degradation. The output reduction is proportional to the integrated AE. The output reduction rate to the integrated AE is a function of GMR temperature. Lifetime can be predicted using these parameters.