DocumentCode
438441
Title
Fast and effective gate-sizing with multiple-Vt assignment using generalized Lagrangian relaxation
Author
Chou, Hsinwei ; Yu-Hao Wane ; Chen, Charlie Chung-Ping
Author_Institution
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
Volume
1
fYear
2005
fDate
21-21 Jan. 2005
Firstpage
381
Abstract
Simultaneous gate-sizing with multiple Vt assignment for delay and power optimization is a complicated task in modern custom designs. In this work, we make the key contribution of a novel gate-sizing and multi-Vt assignment technique based on generalized Lagrangian relaxation. Experimental results show that our technique exhibits linear runtime and memory usage, and can effectively tune circuits with over 15,000 variables and 8,000 constraints in under 8 minutes (250× faster than state-of-the-art optimization solvers).
Keywords
circuit optimisation; integrated circuit design; gate sizing; generalized Lagrangian relaxation; memory usage; multiple-Vt assignment; power optimization; Combinational circuits; Constraint optimization; Delay; Design optimization; Lagrangian functions; Power engineering and energy; Power engineering computing; Runtime; Surges; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2005. Proceedings of the ASP-DAC 2005. Asia and South Pacific
Conference_Location
Shanghai
Print_ISBN
0-7803-8736-8
Type
conf
DOI
10.1109/ASPDAC.2005.1466193
Filename
1466193
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