DocumentCode
440055
Title
Experimental investigations of the intrinsic performance limitations of short channel nonplanar MOS transistors
Author
Heng, T.M.S. ; Oakes, J.G. ; Wickstrom, R.A.
Volume
22
fYear
1976
fDate
1976
Firstpage
7
Lastpage
8
Keywords
Cutoff frequency; Displays; Electrooptic devices; Geometry; Laboratories; Limiting; MOSFETs; Process design; Space charge; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1976 International
Conference_Location
IEEE
Type
conf
Filename
1478851
Link To Document