• DocumentCode
    440084
  • Title

    Effect of selenium effusion rate on CIGS thin films deposited at low substrate temperature

  • Author

    Marsen, Bjorn ; Marsillac, Sylvain ; Dom, Susanne ; Rocheleau, Richard

  • Author_Institution
    Hawaii Natural Energy Inst., Univ. of Hawaii at Manoa, Honolulu, HI, USA
  • fYear
    2005
  • fDate
    3-7 Jan. 2005
  • Firstpage
    386
  • Lastpage
    389
  • Abstract
    To study the issues of film growth at low substrate temperature, Cu(In,Ga)Se2 (CIGS) films have been deposited at substrate temperatures of 350°C under variation of the selenium effusion rate. The properties of the resulting thin films were studied by X-ray diffraction, scanning electron microscopy, and energy dispersive X-ray spectroscopy. Solar cells were fabricated from selected films and characterized by current-voltage and quantum efficiency measurements. While the medium-and high-Se flux samples showed only subtle differences in composition, structure, morphology and device performance, the low-Se samples exhibited very low Cu content, additional chalcopyrite phases, very small grain size, and poor solar cell performance. A minimum selenium/metal flux ratio of 3 is suggested for the low-temperature CIGS deposition process. Higher selenium rates yield modest improvements to solar cell performance at low substrate temperature. The highest cell efficiency, 7.8% at AM1.5 global light, was achieved with a selenium/metal flux ratio of 8.
  • Keywords
    X-ray chemical analysis; X-ray diffraction; X-ray spectra; copper compounds; effusion; gallium compounds; grain size; indium compounds; scanning electron microscopy; semiconductor thin films; solar cells; surface morphology; ternary semiconductors; vacuum deposited coatings; 350 degC; 7.8 percent; AM1.5 global light; CIGS deposition process; CIGS thin films; Cu content; Cu(InGa)Se2; X-ray diffraction; cell composition; cell device performance; cell morphology; cell structure; chalcopyrite phases; current-voltage measurement; energy dispersive X-ray spectroscopy; film growth; grain size; high-Se flux samples; medium-Se flux samples; quantum efficiency measurement; scanning electron microscopy; selenium effusion rate effect; selenium/metal flux ratio; solar cells; substrate temperature; Current measurement; Dispersion; Photovoltaic cells; Scanning electron microscopy; Spectroscopy; Sputtering; Substrates; Temperature; Transistors; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488150
  • Filename
    1488150