• DocumentCode
    442501
  • Title

    Wavelet-based texture features: a new method for sub-band characterization

  • Author

    Mourougaya, François ; Carré, Philippe ; Fernandez-Maloigne, Christine

  • Author_Institution
    SIC Lab., Poitiers Univ., France
  • Volume
    1
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    This paper introduces a new strategy to describe wavelet sub-bands in the scope of texture characterization. While most wavelet-based texture features found in the literature do not use spatial information contained in the wavelet domain, the new approach suggests to represent sub-bands of a texture by shape parameters. This new technique is called wavelet geometrical features (WGF), and is coming from a multiresolution extension of Chen´s statistical geometrical features (SGF). Experiments on the full Brodatz database show the efficiency of the WGF over the SGF and the traditional wavelet energy signature.
  • Keywords
    feature extraction; image classification; image texture; statistical analysis; wavelet transforms; Brodatz database; Chen statistical geometrical features; multiresolution extension; shape parameters; spatial information; subband characterization; texture characterization; wavelet domain; wavelet energy signature; wavelet geometrical features; wavelet-based texture features; Energy resolution; Humans; Image segmentation; Laboratories; Shape; Silicon carbide; Spatial databases; Spatial resolution; Wavelet domain; Wavelet transforms; Geometrical Features; Texture classification; Wavelet transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2005. ICIP 2005. IEEE International Conference on
  • Print_ISBN
    0-7803-9134-9
  • Type

    conf

  • DOI
    10.1109/ICIP.2005.1529783
  • Filename
    1529783