DocumentCode
442501
Title
Wavelet-based texture features: a new method for sub-band characterization
Author
Mourougaya, François ; Carré, Philippe ; Fernandez-Maloigne, Christine
Author_Institution
SIC Lab., Poitiers Univ., France
Volume
1
fYear
2005
fDate
11-14 Sept. 2005
Abstract
This paper introduces a new strategy to describe wavelet sub-bands in the scope of texture characterization. While most wavelet-based texture features found in the literature do not use spatial information contained in the wavelet domain, the new approach suggests to represent sub-bands of a texture by shape parameters. This new technique is called wavelet geometrical features (WGF), and is coming from a multiresolution extension of Chen´s statistical geometrical features (SGF). Experiments on the full Brodatz database show the efficiency of the WGF over the SGF and the traditional wavelet energy signature.
Keywords
feature extraction; image classification; image texture; statistical analysis; wavelet transforms; Brodatz database; Chen statistical geometrical features; multiresolution extension; shape parameters; spatial information; subband characterization; texture characterization; wavelet domain; wavelet energy signature; wavelet geometrical features; wavelet-based texture features; Energy resolution; Humans; Image segmentation; Laboratories; Shape; Silicon carbide; Spatial databases; Spatial resolution; Wavelet domain; Wavelet transforms; Geometrical Features; Texture classification; Wavelet transform;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN
0-7803-9134-9
Type
conf
DOI
10.1109/ICIP.2005.1529783
Filename
1529783
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