• DocumentCode
    444270
  • Title

    Coherent phonons in a semiconductor superlattice studied by femtosecond X-ray diffraction

  • Author

    Bargheer, M. ; Zhavoronkov, N. ; Gritsai, Y. ; Woo, J.C. ; Kim, D.S. ; Woerner, M. ; Elsaesser, T.

  • Author_Institution
    Max-Born-Inst. fur Nichtlineare Optik und Kurzzeitspektroskopie, Berlin, Germany
  • Volume
    2
  • fYear
    2005
  • fDate
    22-27 May 2005
  • Firstpage
    745
  • Abstract
    For the first time femtosecond X-ray diffraction measures the coherent strain connected to a zone-folded longitudinal acoustic phonon optically excited in a GaAs/AlGaAs superlattice, giving direct evidence for the displacive excitation mechanism.
  • Keywords
    III-V semiconductors; X-ray diffraction; aluminium compounds; gallium compounds; high-speed optical techniques; phonons; semiconductor superlattices; GaAs-AlGaAs; acoustic phonon; coherent phonons; coherent strain measurement; displacive excitation mechanism; femtosecond X-ray diffraction; semiconductor superlattice; Acoustic diffraction; Acoustic measurements; Displacement measurement; Optical diffraction; Phonons; Semiconductor superlattices; Strain measurement; Time measurement; Ultrafast optics; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2005. QELS '05
  • Print_ISBN
    1-55752-796-2
  • Type

    conf

  • DOI
    10.1109/QELS.2005.1548924
  • Filename
    1548924