DocumentCode
447716
Title
THz evanescent field spectroscopy
Author
Darmo, J. ; Kröll, J. ; Unterrainer, K.
Author_Institution
Photonics Inst., Vienna Univ. of Technol., Austria
Volume
1
fYear
2005
fDate
19-23 Sept. 2005
Firstpage
18
Abstract
The attenuated total internal reflection spectroscopy at terahertz frequencies is considered. We have focused on the information carried by the interaction of the evanescent field with the optical material in the place of an optical tunneling barrier.
Keywords
attenuated total reflection; optical materials; submillimetre wave spectroscopy; tunnelling; THz evanescent field spectroscopy; internal reflection spectroscopy; optical material; optical tunneling barrier; terahertz frequencies; Frequency; Optical attenuators; Optical materials; Optical pulse generation; Optical reflection; Optical refraction; Optical sensors; Optical surface waves; Spectroscopy; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN
0-7803-9348-1
Type
conf
DOI
10.1109/ICIMW.2005.1572385
Filename
1572385
Link To Document