• DocumentCode
    447765
  • Title

    Counterintuitive behavior of electron temperature in terahertz-driven heterojunctions

  • Author

    Cao, J.C.

  • Author_Institution
    Shanghai Inst. of Microsystem & Inf. Technol., Chinese Acad. of Sci., Shanghai, China
  • Volume
    1
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Firstpage
    146
  • Abstract
    We have studied electron transport and electron-hole pair generation-recombination rate in terahertz-driven InAs/AlSb heterojunctions (HJ). As many as needed multiphoton channels are self-consistently taken into account. Usually, II acts as a cooling mechanism of semiconductor. In the present THz-radiation-driven case with multiphoton process the electron temperature with II process, however, is higher than that without this process. We propose to explain the counterintuitive behavior of electron temperature.
  • Keywords
    III-V semiconductors; aluminium compounds; electron transport theory; electron-hole recombination; indium compounds; semiconductor heterojunctions; two-photon processes; InAs-AlSb; counterintuitive behavior; electron temperature; electron transport; electron-hole pair; generation-recombination rate; multiphoton channels; multiphoton process; semiconductor cooling mechanism; terahertz-driven heterojunctions; Cooling; Electrons; Electrooptic effects; Equations; Frequency; Heterojunctions; Impact ionization; Impurities; Scattering; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
  • Print_ISBN
    0-7803-9348-1
  • Type

    conf

  • DOI
    10.1109/ICIMW.2005.1572450
  • Filename
    1572450