DocumentCode
447765
Title
Counterintuitive behavior of electron temperature in terahertz-driven heterojunctions
Author
Cao, J.C.
Author_Institution
Shanghai Inst. of Microsystem & Inf. Technol., Chinese Acad. of Sci., Shanghai, China
Volume
1
fYear
2005
fDate
19-23 Sept. 2005
Firstpage
146
Abstract
We have studied electron transport and electron-hole pair generation-recombination rate in terahertz-driven InAs/AlSb heterojunctions (HJ). As many as needed multiphoton channels are self-consistently taken into account. Usually, II acts as a cooling mechanism of semiconductor. In the present THz-radiation-driven case with multiphoton process the electron temperature with II process, however, is higher than that without this process. We propose to explain the counterintuitive behavior of electron temperature.
Keywords
III-V semiconductors; aluminium compounds; electron transport theory; electron-hole recombination; indium compounds; semiconductor heterojunctions; two-photon processes; InAs-AlSb; counterintuitive behavior; electron temperature; electron transport; electron-hole pair; generation-recombination rate; multiphoton channels; multiphoton process; semiconductor cooling mechanism; terahertz-driven heterojunctions; Cooling; Electrons; Electrooptic effects; Equations; Frequency; Heterojunctions; Impact ionization; Impurities; Scattering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN
0-7803-9348-1
Type
conf
DOI
10.1109/ICIMW.2005.1572450
Filename
1572450
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