DocumentCode
450370
Title
The Evolution of Design Automation to Meet the Challanges of VLSI
Author
Rosenberg, Lawrence M.
Author_Institution
RCA Laboratories, Somerville, NJ
fYear
1980
fDate
23-25 June 1980
Firstpage
3
Lastpage
11
Abstract
This paper presents the author´s opinion of the major problems confronting Design Automation for VLSI and how Design Automation may evolve to meet these challenges. The paper first takes a historical look at the driving forces for Design Automation development by analyzing the evolution of Design Automation at RCA. It looks at both some successful and unsuccessful development efforts and attempts to isolate some of the criteria necessary for success. It review RCA´s current LSI Design Automation capabilities and compares them to the challenge of VLSI. The major challenges -- layout, design verification and testability -- are discussed along with possible achievable solutions.
Keywords
Automatic testing; Circuit testing; Design automation; History; Integrated circuit testing; Logic testing; Permission; Solid state circuits; System testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1980. 17th Conference on
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1980.1585223
Filename
1585223
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