• DocumentCode
    450401
  • Title

    Design Integrity and Immunity Checking: A New Look at Layout Verification and Design Rule Checking

  • Author

    Mcgrath, Edwar J. ; Whitney, Telle

  • Author_Institution
    California Institute of Technology, Pasadena, CA
  • fYear
    1980
  • fDate
    23-25 June 1980
  • Firstpage
    263
  • Lastpage
    268
  • Abstract
    A program implementing a novel approach to layout verification is presented. The approach uses topological and device information to eliminate most false and unchecked errors. This technique, coupled with a hierarchical front end to eliminated redundant checks, is appropriate for layout verification of VLSI designs. Design rules appropriate for this technique, some usage rules in the context of structured design, and a discussion of the future of design rule checking are also presented.
  • Keywords
    Assembly; Circuits; Computer errors; Computer science; Design methodology; Large scale integration; Permission; Silicon; Space technology; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1980. 17th Conference on
  • Print_ISBN
    0-89791-020-6
  • Type

    conf

  • DOI
    10.1109/DAC.1980.1585254
  • Filename
    1585254