DocumentCode
450401
Title
Design Integrity and Immunity Checking: A New Look at Layout Verification and Design Rule Checking
Author
Mcgrath, Edwar J. ; Whitney, Telle
Author_Institution
California Institute of Technology, Pasadena, CA
fYear
1980
fDate
23-25 June 1980
Firstpage
263
Lastpage
268
Abstract
A program implementing a novel approach to layout verification is presented. The approach uses topological and device information to eliminate most false and unchecked errors. This technique, coupled with a hierarchical front end to eliminated redundant checks, is appropriate for layout verification of VLSI designs. Design rules appropriate for this technique, some usage rules in the context of structured design, and a discussion of the future of design rule checking are also presented.
Keywords
Assembly; Circuits; Computer errors; Computer science; Design methodology; Large scale integration; Permission; Silicon; Space technology; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1980. 17th Conference on
Print_ISBN
0-89791-020-6
Type
conf
DOI
10.1109/DAC.1980.1585254
Filename
1585254
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