DocumentCode
451915
Title
Resolving Signal Correlations for Estimating Maximum Currents in CMOS Combinational Circuits
Author
Kriplani, Harish ; Najm, Farid ; Yang, Ping ; Hajj, Ibrahim
Author_Institution
University of Illinois at Urbana-Champaign
fYear
1993
fDate
14-18 June 1993
Firstpage
384
Lastpage
388
Abstract
Currents flowing in the power and ground (P&G) lines of CMOS digital circuits affect both circuit reliability and performance by causing excessive voltage drops. Maximum current estimates are therefore needed in the P&G lines to determine the severity of the voltage drop problems and to properly design the supply lines to eliminate these problems. These currents, however, depend on the specific input patterns that are applied to the circuit. Since it is prohibitively expensive to enumerate all possible inputs, this problem has, for a long time, remained largely unsolved. In [1], we proposed a pattern-independent, linear time algorithm (iMax) that estimates an upper bound envelope of all possible current waveforms that result from the application of different input patterns to the circuit. While the bound produced by iMax is fairly tight on many circuits, there can be a significant loss in accuracy due to correlations between signals internal to the circuit. In this paper, we present a new partial input enumeration (PIE) algorithm to resolve these correlations and significantly improve the upper bound (in one case, reducing the error by 64% on a circuit with about 1,700 gates). We also show good speed performance, analyzing circuits with more than 20,000 gates in about 2 hours on a SUN ELC. We demonstrate with extensive experimental results that the algorithm represents a good time-accuracy trade-off and is applicable to large VLSI circuits.
Keywords
CMOS digital integrated circuits; Circuit analysis; Combinational circuits; Digital circuits; Performance analysis; Signal resolution; Sun; Upper bound; Very large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993. 30th Conference on
ISSN
0738-100X
Print_ISBN
0-89791-577-1
Type
conf
DOI
10.1109/DAC.1993.203979
Filename
1600252
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