DocumentCode
451938
Title
An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits
Author
Chakravarty, Sreejit ; Gong, Yiming
Author_Institution
Department of Computer Science, State University of New York, Buffalo, NY
fYear
1993
fDate
14-18 June 1993
Firstpage
520
Lastpage
524
Abstract
A novel algorithm for diagnosing all Two-Line Bridging Faults in Combinational Circuits is presented. It assumes the Wired-OR (Wired-AND) model and uses: SOPS to represent the set of possible bridging faults making it space efficient; and a set of rules for dropping faults from the set of possible faults. The rules use fault dictionaries, not for bridging faults but, for stuck-at faults only. Experimental results point to the computational feasibility of considering all two-line bridging faults while diagnosing combinational circuits.
Keywords
Circuit faults; Circuit testing; Combinational circuits; Computer science; Dictionaries; Electric resistance; Feedback; Optimized production technology; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993. 30th Conference on
ISSN
0738-100X
Print_ISBN
0-89791-577-1
Type
conf
DOI
10.1109/DAC.1993.204003
Filename
1600276
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