• DocumentCode
    451938
  • Title

    An Algorithm for Diagnosing Two-Line Bridging Faults in Combinational Circuits

  • Author

    Chakravarty, Sreejit ; Gong, Yiming

  • Author_Institution
    Department of Computer Science, State University of New York, Buffalo, NY
  • fYear
    1993
  • fDate
    14-18 June 1993
  • Firstpage
    520
  • Lastpage
    524
  • Abstract
    A novel algorithm for diagnosing all Two-Line Bridging Faults in Combinational Circuits is presented. It assumes the Wired-OR (Wired-AND) model and uses: SOPS to represent the set of possible bridging faults making it space efficient; and a set of rules for dropping faults from the set of possible faults. The rules use fault dictionaries, not for bridging faults but, for stuck-at faults only. Experimental results point to the computational feasibility of considering all two-line bridging faults while diagnosing combinational circuits.
  • Keywords
    Circuit faults; Circuit testing; Combinational circuits; Computer science; Dictionaries; Electric resistance; Feedback; Optimized production technology; Semiconductor device modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation, 1993. 30th Conference on
  • ISSN
    0738-100X
  • Print_ISBN
    0-89791-577-1
  • Type

    conf

  • DOI
    10.1109/DAC.1993.204003
  • Filename
    1600276