DocumentCode
451945
Title
Practical Statistical Design of Complex Integrated Circuit Products
Author
Duvall, Steven G.
Author_Institution
Intel Corporation, Santa Clara, CA
fYear
1993
fDate
14-18 June 1993
Firstpage
561
Lastpage
565
Abstract
A practical methodology for the statistical design of complex, logic integrated circuit products is described. It virtually eliminates the overhead associated with statistical modeling by combining a fully automatic, computationally-efficient statistical circuit simulator and worst case simulation tools into a hierarchical design flow.
Keywords
Analytical models; Capacitance; Circuit simulation; Computational modeling; Design methodology; Integrated circuit interconnections; Logic circuits; Logic design; Process design; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation, 1993. 30th Conference on
ISSN
0738-100X
Print_ISBN
0-89791-577-1
Type
conf
DOI
10.1109/DAC.1993.204010
Filename
1600283
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