DocumentCode
452921
Title
Investigation on optimal materials selection in RTD-Fluxgate Design
Author
Andò, B. ; Baglio, S. ; Sacco, V. ; Savalli, N. ; Bulsara, A.
Author_Institution
Dipt. di Ingegneria Elettrica Elettronica e dei Sistemi, Catania Univ.
Volume
2
fYear
2005
fDate
16-19 May 2005
Firstpage
1261
Lastpage
1265
Abstract
The aim of this paper is to present experimental results, along with analytical calculations, on different prototypes of RTD fluxgate using a set of three ferromagnetic materials. The residence times difference approach is based on the time domain characterization of the transitions between the stable steady states of the hysteresis loop whose features are related to the external magnetic field to be measured. Experiments and studies reported in the following sections aim to give guidelines for the optimal system design in terms of sensitivity and power budget, exploiting the features of the ferromagnetic materials used as core. The prototypes developed at the DIEES of the Engineering Faculty in Catania and used during the experiments represent test vehicles. Moreover they allow the validation of the theoretical considerations made on the subject in view of future integrated realizations of fluxgates with RTD readout strategy to demonstrate how a suitable choice of the core material can improve the devices performances
Keywords
ferromagnetic materials; fluxgate magnetometers; magnetic hysteresis; magnetic transitions; resonant tunnelling diodes; RTD readout strategy; RTD-fluxgate design; external magnetic field; ferromagnetic materials; hysteresis loop; optimal materials selection; time domain characterization; Automotive engineering; Guidelines; Magnetic analysis; Magnetic cores; Magnetic field measurement; Magnetic hysteresis; Magnetic materials; Prototypes; Steady-state; Time measurement; FluxGate sensors; high sensitivity; low excitation filed; low power; simple topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location
Ottawa, Ont.
Print_ISBN
0-7803-8879-8
Type
conf
DOI
10.1109/IMTC.2005.1604350
Filename
1604350
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