• DocumentCode
    460187
  • Title

    Evaluation of Strain Field Around SIC Particle in Poly-Crystalline Silicon

  • Author

    Ujihara, T. ; Ichitsubo, T. ; Usami, N. ; Nakajima, K. ; Takeda, Y.

  • Author_Institution
    Dept. of Crystalline Mater. Sci., Nagoya Univ.
  • Volume
    1
  • fYear
    2006
  • fDate
    38838
  • Firstpage
    1064
  • Lastpage
    1066
  • Abstract
    Cast poly-crystalline silicon is unexpectedly contaminated with a large amount of oxygen and carbon impurities. However, the effect of carbon impurity is ambiguity. Recently, we made clear carbon impurity is locally super-saturated near grain boundaries. This local super-saturation can induce the precipitation of SiC particle. In this study, we investigated the influence of SiC particle to solar cell property, especially focusing the effect of the band-gap shrinkage induced by strain field in silicon caused by SiC precipitates. The strain field was directly observed by micro-Raman spectroscopy. Moreover, the strain field could be reproduced by calculation based on Eshelby´s theory assuming strain is mainly due to the difference of thermal expansion. The strain was 0.1-0.2 % by experiments and 0.03-0.07 % by the calculations. The compressive or tensile strain of 0.03-0.2 % decreases the band-gap by 25-36 meV, which is equivalent to the thermal excitation energy at room temperature. This band-gap shrinkage is too small to capture carriers
  • Keywords
    Raman spectra; carbon; compressive strength; elemental semiconductors; energy gap; grain boundaries; impurities; precipitation; shrinkage; silicon; silicon compounds; solar cells; tensile strength; thermal expansion; wide band gap semiconductors; C; Eshelby theory; Si; SiC; band-gap shrinkage; carbon impurities; cast polycrystalline silicon; compressive strain; grain boundaries; microRaman spectroscopy; precipitation; solar cell; strain field; tensile strain; thermal excitation energy; thermal expansion; Capacitive sensors; Grain boundaries; Impurities; Photonic band gap; Photovoltaic cells; Silicon carbide; Spectroscopy; Temperature; Tensile strain; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, Conference Record of the 2006 IEEE 4th World Conference on
  • Conference_Location
    Waikoloa, HI
  • Print_ISBN
    1-4244-0017-1
  • Electronic_ISBN
    1-4244-0017-1
  • Type

    conf

  • DOI
    10.1109/WCPEC.2006.279324
  • Filename
    4059815