Proton-induced degradation in high-resolution Geiger tracking detectors

We developed high-resolution, high-internal gain (10⁶) charged-particle tracking silicon active-pixel detector arrays operated in Geiger mode (GAPS) for microvertex applications. In this paper we verify the radiation tolerance of GAPS detectors after irradiation with 55 MeV protons up to 3 times 10¹¹ p/cm². We confirm 100% detection efficiency of charged particle events before and after irradiation. The dark count rate increases from 1 KHz to 6 KHz at room temperature after irradiation with protons up to 1 times 10¹¹ p/cm², and anneals at a rate of 0.32%/day.