• DocumentCode
    462498
  • Title

    Radiation Detectors for HEP Applications Using Standard CMOS Technology

  • Author

    Passeri, D. ; Marras, A. ; Placidi, P. ; Delfanti, P. ; Biagetti, D. ; Servoli, L. ; Bilei, G.M. ; Ciampolini, P.

  • Author_Institution
    Dipt. di Ingegneria Elettronica e dell´´Informazione, Universita di Perugia
  • Volume
    2
  • fYear
    2006
  • fDate
    Oct. 29 2006-Nov. 1 2006
  • Firstpage
    1253
  • Lastpage
    1256
  • Abstract
    The suitability of standard CMOS technology featuring no epitaxial layer for particle detection has been investigated through extensive experimental characterization. Different pixel layout and read-out schemes have been devised and implemented, as well as different test strategies. In this work test results are reported concerning the response of the detector to IR laser, beta-particles and X-rays stimuli, thus confirming the suitability of the proposed approach for high energy physics applications.
  • Keywords
    CMOS integrated circuits; nuclear electronics; semiconductor counters; CMOS technology; HEP applications; high energy physics; particle detection; radiation detectors; CMOS technology; Laser noise; Optical noise; Optical sensors; Radiation detectors; Semiconductor device noise; Semiconductor lasers; Sensor arrays; Testing; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2006. IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1095-7863
  • Print_ISBN
    1-4244-0560-2
  • Electronic_ISBN
    1095-7863
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2006.356071
  • Filename
    4179225