DocumentCode
462498
Title
Radiation Detectors for HEP Applications Using Standard CMOS Technology
Author
Passeri, D. ; Marras, A. ; Placidi, P. ; Delfanti, P. ; Biagetti, D. ; Servoli, L. ; Bilei, G.M. ; Ciampolini, P.
Author_Institution
Dipt. di Ingegneria Elettronica e dell´´Informazione, Universita di Perugia
Volume
2
fYear
2006
fDate
Oct. 29 2006-Nov. 1 2006
Firstpage
1253
Lastpage
1256
Abstract
The suitability of standard CMOS technology featuring no epitaxial layer for particle detection has been investigated through extensive experimental characterization. Different pixel layout and read-out schemes have been devised and implemented, as well as different test strategies. In this work test results are reported concerning the response of the detector to IR laser, beta-particles and X-rays stimuli, thus confirming the suitability of the proposed approach for high energy physics applications.
Keywords
CMOS integrated circuits; nuclear electronics; semiconductor counters; CMOS technology; HEP applications; high energy physics; particle detection; radiation detectors; CMOS technology; Laser noise; Optical noise; Optical sensors; Radiation detectors; Semiconductor device noise; Semiconductor lasers; Sensor arrays; Testing; X-rays;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2006. IEEE
Conference_Location
San Diego, CA
ISSN
1095-7863
Print_ISBN
1-4244-0560-2
Electronic_ISBN
1095-7863
Type
conf
DOI
10.1109/NSSMIC.2006.356071
Filename
4179225
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