• DocumentCode
    462970
  • Title

    Tracing the Defect Location (TDL)

  • Author

    Lee, Jeong-Cheol ; Dae-Young Kim

  • Volume
    1
  • fYear
    2007
  • fDate
    12-14 Feb. 2007
  • Firstpage
    337
  • Lastpage
    339
  • Abstract
    TDL is the system that converts the analog process to digital process. During the process of building the substrate, there can be many defects which are generated by both a human and other environmental things. To reduce the redundant process like handling by human-beings, TDL can substitute physical operation for logical process.
  • Keywords
    bar codes; data communication; optical character recognition; analog process; digital process; logical process; tracing the defect location; Character recognition; Charge coupled devices; Continuous wavelet transforms; Humans; Ink; Laser theory; Optical character recognition software; Shape; Strips; Tellurium; Tracing the Defect Location (IDL); digital process; logicalprocess;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Communication Technology, The 9th International Conference on
  • Conference_Location
    Gangwon-Do
  • ISSN
    1738-9445
  • Print_ISBN
    978-89-5519-131-8
  • Type

    conf

  • DOI
    10.1109/ICACT.2007.358367
  • Filename
    4195146
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=462970