DocumentCode
464683
Title
Comprehensive Modeling of Stress-Strain Behavior for Lead-Free Solder Joints under Board-Level Drop Impact Loading Condition
Author
Che, F.X. ; Pang, John H L ; Zhu, W.H. ; Sun, Wei ; Sun, Anthony ; Wang, C.K. ; Tan, H.B.
Author_Institution
United Test & Assembly Center Ltd., Singapore
fYear
2007
fDate
May 29 2007-June 1 2007
Firstpage
528
Lastpage
535
Abstract
Board level drop testing is an effective method to characterize the solder joint reliability performance of miniature handheld products. In this study, some drop testing results were summarized based on our previous board-level drop tests. And then the finite element modeling and simulation were conducted to investigate and understand the drop reliability of lead-free solder joints by considering different factors. The strain-rate dependent material properties for lead-free solder has been developed by us and successfully applied in FEA simulation. The important finding of this study is that the constitutive model used has a major impact on dynamic response of solder joint stress and strain results. It was expected that the strain-rate dependent plastic model gave better correlation results than the simple elastic model or bilinear plastic model. In addition to solder material properties, many other factors, including package locations on the PCB, boundary conditions, input-G level, PCB thickness and solder materials, were also simulated to investigate their effects on stress strain performance of solder joint. Comparing to clamped boundary, the 4-screw support condition leads to higher stress level in solder joint. Higher input G-level results in higher solder stress due to larger inertial force and deflection effects on solder joint. The thinner PCB and softer solder can improve the drop performance of board-level electronic assembly.
Keywords
circuit reliability; finite element analysis; impact testing; mobile handsets; printed circuit testing; solders; stress-strain relations; board level drop testing; board-level drop impact loading condition; dynamic response; finite element modeling; handheld electronics; lead-free solder joint; stress-strain behavior; Capacitive sensors; Environmentally friendly manufacturing techniques; Finite element methods; Lead; Material properties; Packaging; Plastics; Soldering; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2007. ECTC '07. Proceedings. 57th
Conference_Location
Reno, NV
ISSN
0569-5503
Print_ISBN
1-4244-0985-3
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2007.373847
Filename
4249933
Link To Document