DocumentCode
467753
Title
Optimization Design of Electrical Resistance Tomography Data Acquisition System
Author
Dong, Feng ; Li, Er-Ping ; Wang, Bin-Bin
Author_Institution
Tianjin Univ., Tianjin
Volume
3
fYear
2007
fDate
19-22 Aug. 2007
Firstpage
1454
Lastpage
1458
Abstract
The process tomography based on electrical sensitive principles is a new technology which aims at section information measurement. Electrical Resistance Tomography is one kind of process tomography which is based on electrical sensitive principle. It has advantages of being non-intrusive, non-radiate, online visual monitoring and low in cost. There are some disadvantages in data acquisition speed, stability and reliability in the existing ERT system. Aiming at these problems, a new ERT data acquisition system based on digital I/O card and A/D conversion card is developed; every other module of the ERT system make an improvement: the system backboard uses an user-defined bus; the sine-wave generator module use a DDS chip to generate signals whose phase, amplitude and frequency can change easily; a multiplication demodulation which can be controlled easily has been used to improve the transition speed. By calculation, the data acquisition speed of the system has been improved. The structure is simple, so the stability and reliability is better than before.
Keywords
analogue-digital conversion; computerised monitoring; computerised tomography; data acquisition; digital signal processing chips; electric impedance imaging; electric resistance measurement; A/D conversion card; DDS chip; data acquisition speed; data acquisition system; digital I/O card; electrical resistance tomography; electrical sensitive principle; multiplication demodulation; online visual monitoring; sine-wave generator module; system backboard; user-defined bus; Costs; Data acquisition; Design optimization; Electric resistance; Electric variables measurement; Electrical resistance measurement; Monitoring; Signal generators; Stability; Tomography; Data acquisition system; Electrical Resistance Tomography; Optimum design;
fLanguage
English
Publisher
ieee
Conference_Titel
Machine Learning and Cybernetics, 2007 International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-0973-0
Electronic_ISBN
978-1-4244-0973-0
Type
conf
DOI
10.1109/ICMLC.2007.4370374
Filename
4370374
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