• DocumentCode
    469360
  • Title

    Solder Joint Reliability (SJR) Study of Integrated Heat Spreader (IHS) Packages

  • Author

    Shaw Fong Wong ; Wei Keat Loh ; Kang Eu Ong ; Yung Hsiang Lee ; Huey Ling Lew ; Seok Ling Lee

  • Author_Institution
    Intel Technol., Penang
  • fYear
    2006
  • fDate
    11-14 Dec. 2006
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    This paper discusses the SJR performance and characteristic study for IHS package technology. Limited industry literature for design reference is the key motivator of this IHS base SJR evaluation on various stresses. Both experimental and simulation studies were performed to identify the critical reliability factors impacting the SJR in static compressive, mechanical shock and transient bend stresses. The critical SJR factors on thermo-mechanical fatigue included solder systems, types of preload and board thickness design were investigated. The impacts of ball pitches, board thicknesses and ball attach process in shock loading will be discussed. Furthermore, the sensitivities contributed by ball pitches, board thicknesses and trace orientation design on transient bend were evaluated as well. Beside, the performance trends and failure modes were analyzed to gather better understanding especially on its driving mechanism. As a summary, this paper presents and documents the key influence factors in SJR for electronic package design in IHS configuration.
  • Keywords
    ball grid arrays; failure analysis; integrated circuit packaging; reliability; soldering; thermal management (packaging); ball attach process; ball pitches; board thicknesses; electronic package design; flip chip ball grid array; integrated heat spreader packages; mechanical shock; shock loading; solder joint reliability; static compressive stresses; thermo-mechanical fatigue; trace orientation design; transient bend stresses; Assembly; Compressive stress; Electric shock; Electronic packaging thermal management; Electronics packaging; Semiconductor device packaging; Soldering; Thermal resistance; Thermal stresses; Thermomechanical processes; Integrated Heat Spreader (IHS) Packages; Solder Joint Reliability (SJR);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Materials and Packaging, 2006. EMAP 2006. International Conference on
  • Conference_Location
    Kowloon
  • Print_ISBN
    978-1-4244-0834-4
  • Electronic_ISBN
    978-1-4244-0834-4
  • Type

    conf

  • DOI
    10.1109/EMAP.2006.4430588
  • Filename
    4430588