DocumentCode
471700
Title
EOG and EMG: Two Important Switches in Automatic Sleep Stage Classification
Author
Estrada, E. ; Nazeran, H. ; Barragan, J. ; Burk, J.R. ; Lucas, E.A. ; Behbehani, K.
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Univ., El Paso, TX
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
2458
Lastpage
2461
Abstract
Sleep is a natural periodic state of rest for the body, in which the eyes are usually closed and consciousness is completely or partially lost. In this investigation we used the EOG and EMG signals acquired from 10 patients undergoing overnight polysomnography with their sleep stages determined by expert sleep specialists based on RK rules. Differentiation between Stage 1, Awake and REM stages challenged a well trained neural network classifier to distinguish between classes when only EEG-derived signal features were used. To meet this challenge and improve the classification rate, extra features extracted from EOG and EMG signals were fed to the classifier. In this study, two simple feature extraction algorithms were applied to EOG and EMG signals. The statistics of the results were calculated and displayed in an easy to visualize fashion to observe tendencies for each sleep stage. Inclusion of these features show a great promise to improve the classification rate towards the target rate of 100%
Keywords
electro-oculography; electroencephalography; electromyography; feature extraction; medical signal processing; neural nets; neurophysiology; signal classification; sleep; EEG-derived signal features; EMG; EOG; REM stage; RK rules; automatic sleep stage classification; awake stage; eyes; feature extraction; neural network classifier; overnight polysomnography; Artificial neural networks; Electroencephalography; Electromyography; Electrooculography; Feature extraction; Laboratories; Sleep; Switches; Testing; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260075
Filename
4462292
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