• DocumentCode
    471935
  • Title

    Knowledge Creation Using Artificial Intelligence: A Twin Approach to Improve Breast Screening Attendance

  • Author

    Baskaran, Vikraman ; Bali, Rajeev K. ; Arochena, Hisbel ; Naguib, Raouf N G ; Wallis, Matthew ; Wheaton, Margot

  • Author_Institution
    Biomed. Comput. & Eng. Technol. Appl. Res. Group, Coventry Univ.
  • fYear
    2006
  • fDate
    Aug. 30 2006-Sept. 3 2006
  • Firstpage
    4070
  • Lastpage
    4073
  • Abstract
    Knowledge management (KM) is rapidly becoming established as a core organizational element within the healthcare industry to assist in the delivery of better patient care. KM is a cyclical process which typically starts with knowledge creation (KC), progresses to knowledge sharing, knowledge accessibility and eventually results in new KC (in the same or a related domain). KC plays a significant role in KM as it creates the necessary "seeds" for propagating many more knowledge cycles. This paper addresses the potential of KC in the context of the UK\´s National Health Service (NHS) breast screening service. KC can be automated to a greater extent by embedding processes within an artificial intelligence (AI) based environment. The UK breast screening service is concerned about non-attendance and this paper discusses issues pertaining to increasing attendance
  • Keywords
    diagnostic radiography; gynaecology; health care; knowledge engineering; knowledge management; mammography; medical diagnostic computing; patient care; UK National Health Service; artificial intelligence; breast screening attendance; healthcare industry; knowledge accessibility; knowledge creation; knowledge management; knowledge sharing; mammography; patient care; Artificial intelligence; Biomedical computing; Biomedical engineering; Breast; Cities and towns; Education; Electronic mail; Hospitals; Medical services; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1557-170X
  • Print_ISBN
    1-4244-0032-5
  • Electronic_ISBN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/IEMBS.2006.260645
  • Filename
    4462694