DocumentCode
472131
Title
Computer Modeling Provides a New Tool for Clinically Diagnosing Melanoma Spread through the Lymphatics
Author
Reynolds, Hayley M. ; Dunbar, P. Rod ; Uren, R.F. ; Smith, Nicolas P.
Author_Institution
Bioeng. Inst., Auckland Univ.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
5307
Lastpage
5310
Abstract
In this study an anatomically accurate framework is presented to visualize clinical melanoma data in 3D. Sentinel lymph node biopsy (SLNB) data from the Sydney Melanoma Unit (SMU) has been used, where each patient´s primary cutaneous melanoma site and corresponding sentinel lymph node locations have been recorded. Anatomically accurate finite element geometries of the skin and lymph nodes have been created using the visible human dataset. SMU´s full SLNB database has been mapped from 2D onto this 3D anatomical framework via free-form deformation and projection techniques. Spatial statistical analysis and heat map displays have been calculated and visualized relating melanoma sites on the skin to sentinel lymph node fields. These detailed spatial maps provide the first anatomically accurate link between skin sites and lymphatic drainage. The extension and ongoing application of this work in the clinic is a novel method to capture data for both improved melanoma diagnosis and a better understanding of lymphatic drainage in the body
Keywords
cancer; data visualisation; finite element analysis; medical diagnostic computing; skin; statistical analysis; tumours; 3D anatomical framework; 3D data visualization; Sydney Melanoma Unit; computer modeling; finite element geometry; free-form deformation; heat map displays; lymph node biopsy; lymph node locations; lymphatic drainage; melanoma diagnosis; projection techniques; skin; spatial statistical analysis; Biopsy; Data visualization; Finite element methods; Geometry; Humans; Lymph nodes; Malignant tumors; Skin; Spatial databases; Visual databases;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.259726
Filename
4463002
Link To Document