DocumentCode
472272
Title
Magnetoencephalogram background activity analysis in Alzheimer´s disease patients using auto mutual information
Author
Gomez, Carlos ; Hornero, Roberto ; Fernandez, Alberto ; Abasolo, Daniel ; Escudero, Javier ; Lopez, Miguel
Author_Institution
E. T. S. Ingenieros de Telecomunicacion, Valladolid Univ.
fYear
2006
fDate
Aug. 30 2006-Sept. 3 2006
Firstpage
6181
Lastpage
6184
Abstract
The goal of this study was to analyze the magnetoencephalogram (MEG) background activity in patients with Alzheimer´s disease (AD) using the auto mutual information (AMI). Applied to time series, AMI provides a measure of future points predictability from past points. Five minutes of recording were acquired with a 148-channel whole-head magnetometer (MAGNES 2500 WH, 4D neuroimaging) in 12 patients with probable AD and 12 elderly control subjects. Artifact-free epochs of 20 seconds (3392 points, sample frequency of 169.6 Hz) were selected for our study. Our results showed that the absolute values of the averaged decline rate of AMI were lower in AD patients than in control subjects for all channels. In addition, there were statistically significant differences (p<0.01, Student´s t-test) in most channels. These preliminary results suggest that neuronal dysfunction in AD is associated with differences in the dynamical processes underlying the MEG recording
Keywords
diseases; magnetoencephalography; magnetometers; neurophysiology; statistical analysis; 20 s; 4D neuroimaging; 5 mins; Alzheimer disease; MAGNES 2500 WH; MEG recording; auto mutual information; dynamical processes; magnetoencephalogram background activity analysis; neuronal dysfunction; statistical analysis; student t-test; whole-head magnetometer; Alzheimer´s disease; Ambient intelligence; Frequency; Information analysis; Magnetic analysis; Magnetometers; Mutual information; Neuroimaging; Senior citizens; Time measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society, 2006. EMBS '06. 28th Annual International Conference of the IEEE
Conference_Location
New York, NY
ISSN
1557-170X
Print_ISBN
1-4244-0032-5
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/IEMBS.2006.260317
Filename
4463220
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