DocumentCode
472738
Title
Soft-Error Immune Switched-Load-Resistor Memory Cell
Author
Homma, Noriyuki ; Nakamura, Tohru ; Hayashida, Tetsuya ; Matsumoto, Motoaki ; Nakazato, Kazuo ; Onai, Takahiro ; Tamaki, Youichi ; Namba, Mitsuo ; Sagara, Kazuhiko ; Ikeda, Kiyoji
Author_Institution
Central Research Laboratory, Hitachi Ltd, Kokubunji, Tokyo 185
fYear
1987
fDate
22-23 May 1987
Firstpage
37
Lastpage
38
Keywords
Capacitance; Electrons; Isolation technology; Laboratories; Noise generators; Noise reduction; Random access memory; Read-write memory; Silicon; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, 1987. Digest of Technical Papers. Symposium on
Conference_Location
Karuizawa, Japan
Type
conf
Filename
4480410
Link To Document