• DocumentCode
    473968
  • Title

    THz time-domain spectroscopy uncertainties

  • Author

    Lin, Hungyen ; Withayachumnankul, W. ; Fischer, Bernd M. ; Mickan, Samuel P. ; Abbott, Derek

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Univ. of Adelaide, Adelaide, SA
  • fYear
    2007
  • fDate
    2-9 Sept. 2007
  • Firstpage
    222
  • Lastpage
    223
  • Abstract
    THz time-domain spectroscopy (TDS) is a significant technique for material characterization as it seeks to determine the optical or dielectric constants in the T-ray regime. The precision of the constants is highly affected by the intricate THz-TDS process. Typically, a short-pulsed THz-TDS system is composed of several mechanical, optical, and electronic parts, each of which is limited in precision and therefore has an effect on the uncertainty of the achieved optical or dielectric constants. This paper analyses sources of uncertainty and models error propagation through the system.
  • Keywords
    optical constants; permittivity; submillimetre wave spectroscopy; time-domain analysis; THz time-domain spectroscopy; THz-TDS process; dielectric constants; error propagation; material characterization; optical constants; Fluctuations; Optical noise; Optical propagation; Optical pumping; Optical refraction; Optical variables control; Spectroscopy; Time domain analysis; Ultrafast optics; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
  • Conference_Location
    Cardiff
  • Print_ISBN
    978-1-4244-1438-3
  • Type

    conf

  • DOI
    10.1109/ICIMW.2007.4516470
  • Filename
    4516470