DocumentCode
474175
Title
A millimeter-wave sampled-line six-port reflectometer at 300GHz
Author
Wu, Guoguang ; Liu, Zhiyang ; Weikle, Robert M.
Author_Institution
Dept. of Phys., Virginia Univ., Charlottesville, VA
fYear
2007
fDate
2-9 Sept. 2007
Firstpage
775
Lastpage
776
Abstract
The six-port reflectometer is believed to be applied in the next generation of network analyzer, especially as working at high frequency in the microwave region. In our work, a six- port circuit is designed to measure the reflection coefficients and phases of some standard loads. The comparison of the six-port measurement to network analyzer and the theoretical result is also done afterward.
Keywords
electromagnetic wave reflection; millimetre wave measurement; multiport networks; network analysers; reflectometers; millimeter-wave sampled-line six-port reflectometer; network analyzers; reflection coefficient measurement; Calibration; Circuits; Current measurement; Diodes; Frequency; Measurement standards; Millimeter wave technology; Phase measurement; Reflection; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared and Millimeter Waves, 2007 and the 2007 15th International Conference on Terahertz Electronics. IRMMW-THz. Joint 32nd International Conference on
Conference_Location
Cardiff
Print_ISBN
978-1-4244-1438-3
Type
conf
DOI
10.1109/ICIMW.2007.4516725
Filename
4516725
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