• DocumentCode
    474467
  • Title

    Cache modeling in probabilistic execution time analysis

  • Author

    Liang, Yun ; Mitra, Tulika

  • Author_Institution
    Sch. of Comput., Nat. Univ. of Singapore, Singapore
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    319
  • Lastpage
    324
  • Abstract
    Multimedia-dominated consumer electronics devices (such as cellular phone, digital camera, etc.) operate under soft real-time constraints. Overly pessimistic worst-case execution time analysis techniques borrowed from hard real-time systems domain are not particularly suitable in this context. Instead, the execution time distribution of a task provides a more valuable input to the system-level performance analysis frameworks. Both program inputs and underlying architecture contribute to the execution time variation of a task. But existing probabilistic execution time analysis approaches mostly ignore architectural modeling. In this paper, we take the first step towards remedying this situation through instruction cache modeling. We introduce the notion of probabilistic cache states to model the evolution of cache content during program execution over multiple inputs. In particular, we estimate the mean and variance of execution time of a program across inputs in the presence of instruction cache. The experimental evaluation confirms the scalability and accuracy of our probabilistic cache modeling approach.
  • Keywords
    cache storage; consumer electronics; multimedia computing; probability; architectural modeling; cache modeling; execution time distribution; multimedia-dominated consumer electronics devices; probabilistic execution time analysis; system-level performance analysis; Aerospace electronics; Automotive engineering; Consumer electronics; Embedded computing; Embedded system; Performance analysis; Permission; Processor scheduling; Real time systems; Timing; Cache Modeling; Probabilistic Execution Time Analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2008. DAC 2008. 45th ACM/IEEE
  • Conference_Location
    Anaheim, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-60558-115-6
  • Type

    conf

  • Filename
    4555831