DocumentCode
474648
Title
Degradation of organic light-emitting diodes: Dependence on deposition rate
Author
Liu, Shun-Wei ; Lee, Chih-Chien ; Huang, Guo-Jun ; Lee, Jiun-Haw ; Chen, Chin-Ti ; Wang, Juen-Kai
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
fYear
2008
fDate
4-9 May 2008
Firstpage
1
Lastpage
2
Abstract
The dependence of device degradation of organic light-emitting diodes (OLEDs) on film deposition rate is presented. The OLEDs made by lower deposition rates exhibit short device lifetime, which is attributed to the formed ordered aggregates.
Keywords
brightness; organic light emitting diodes; photoluminescence; device degradation; organic light-emitting diodes:; Aggregates; Charge carrier processes; Electron mobility; Indium tin oxide; Optical films; Organic light emitting diodes; Photoluminescence; Pulsed laser deposition; Thermal degradation; Voltage; 230.3670 light-emitting diodes; 250.5230 Photoluminescence;
fLanguage
English
Publisher
iet
Conference_Titel
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on
Conference_Location
San Jose, CA
Print_ISBN
978-1-55752-859-9
Type
conf
Filename
4572324
Link To Document