• DocumentCode
    476056
  • Title

    Optimal regularization parameter in approximate TPS interpolation

  • Author

    Guo, Song-na ; Yang, Xuan ; Sun, Hong-yuan

  • Author_Institution
    Coll. of Inf. Eng., Shenzhen Univ., Shenzhen
  • Volume
    3
  • fYear
    2008
  • fDate
    12-15 July 2008
  • Firstpage
    1347
  • Lastpage
    1352
  • Abstract
    The thin plate splines (TPS) has been applied to landmark-based elastic image registration. However, TPS forces the corresponding landmarks to exactly match each other, which is problematic when the localization of landmarks is prone to some error. Approximating TPS (ATPS) has been proposed to weak the interpolation condition. In ATPS, the regularization parameter plays an important role. It controls the smoothness of the transformation. Unfortunately, how to estimate is not solved. In this paper, estimation of the optimal regularization parameter has been proposed. It combines two evaluation factors, smoothness and location error hypothesis testing, to evaluate transformation results using fuzzy integral. The optimal regularization parameter is the best value maximizing the evaluation function. Experiments of the artificial grids and medial images show that our technique is feasible.
  • Keywords
    approximation theory; fuzzy set theory; image matching; image registration; integral equations; interpolation; splines (mathematics); approximate TPS interpolation; fuzzy integral; landmark-based elastic image registration; location error hypothesis testing; optimal regularization parameter; regularization parameter; thin plate splines; Chemical engineering; Chemistry; Cybernetics; Educational institutions; Finite element methods; Image registration; Interpolation; Machine learning; Surface fitting; Testing; Fuzzy Integral; Regularization Parameter; Thin-Plate Spline;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Machine Learning and Cybernetics, 2008 International Conference on
  • Conference_Location
    Kunming
  • Print_ISBN
    978-1-4244-2095-7
  • Electronic_ISBN
    978-1-4244-2096-4
  • Type

    conf

  • DOI
    10.1109/ICMLC.2008.4620614
  • Filename
    4620614