DocumentCode
47788
Title
Dependence of charge accumulation on sample thickness in Nano-SiO2 doped IDPE
Author
Zepeng Lv ; Xia Wang ; Kai Wu ; Xi Chen ; Yonghong Cheng ; Dissado, Leonard
Author_Institution
State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
Volume
20
Issue
1
fYear
2013
fDate
Feb-13
Firstpage
337
Lastpage
345
Abstract
The effect on space charge accumulation of the introduction of nano-filler into polyethylene is usually studied using thin 100 μm samples in electric fields reaching 100 kV/mm. However, the insulation thickness in an actual HVDC cable is usually some centimeters. Thus there is a great thickness difference between the experiment sample and the insulation application. Here we investigate the thickness dependence of space charge accumulation in unfilled and LDPE doped with nano-SiO2 over a range of temperatures in a field of 50 kV/mm. It is found that the space charge in LDPE/SiO2 nanocomposites exhibits marked thickness dependence whereas in the unfilled LDPE it shows very little thickness dependence. A simulation based on the bipolar injection model and Takada´s trapping potential model has been carried out in order to explain the differences. It is found that when the simulation included the effects of charge injection, extraction, trapping, recombination, mobility and diffusion, it is able to explain the heterocharge formation in the unfilled LDPE, and the thickness dependence in the two kinds of materials.
Keywords
nanocomposites; polyethylene insulation; silicon compounds; space charge; HVDC cable; SiO2; Takada´s trapping potential model; bipolar injection model; charge dependence; charge injection; diffusion; doped LDPE; electric fields; heterocharge formation; insulation application; mobility; nano-filler; polyethylene; sample thickness; space charge accumulation; trapping; unfilled LDPE; Anodes; Cathodes; Electron traps; Nanocomposites; Space charge; Space charge; nanocomposites; recombination; thickness; trap;
fLanguage
English
Journal_Title
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher
ieee
ISSN
1070-9878
Type
jour
DOI
10.1109/TDEI.2013.6451375
Filename
6451375
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