• DocumentCode
    481321
  • Title

    Multiscale model of honed profiles

  • Author

    Wu, Liqun ; Quan, Taiwei ; Zeng, Wenhan ; Jiang, Xiangqian

  • Author_Institution
    Hangzhou Dianzi University, 310018, China
  • fYear
    2006
  • fDate
    6-7 Nov. 2006
  • Firstpage
    1339
  • Lastpage
    1341
  • Abstract
    Some important profiles such as that made by honing process are skew and complex. In this paper, a new and more flexible elementary function was found to create a advanced multiscale model defined by an infinite series. In this series, each elementary term characterized a skew feature at a given scale. Some honed profiles were measured and tested by a tactile PGI profiler. The results showed that our model was allowed to characterize the skew phenomenon. Then a method was developed to study the smoothing effect caused by the stylus radius with the theory of the fractal peak radius curvature of the skew profiles. And a critical scale was found in this paper.
  • Keywords
    Skew; honed; model; multiscale; profile;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Technology and Innovation Conference, 2006. ITIC 2006. International
  • Conference_Location
    Hangzhou
  • ISSN
    0537-9989
  • Print_ISBN
    0-86341-696-9
  • Type

    conf

  • Filename
    4752213