• DocumentCode
    483091
  • Title

    Modeling of potential transformers for the very fast transient simulation based on wideband scattering parameter measurements

  • Author

    Dong, Huaying ; Ji, Changhu ; Liang, Guishu ; Tao, Wang ; Liu, Xin

  • Author_Institution
    Sch. of Electr. Eng., North China Electr. Power Univ., Baoding
  • fYear
    2008
  • fDate
    17-20 Oct. 2008
  • Firstpage
    4061
  • Lastpage
    4064
  • Abstract
    The wide frequency circuit models of instrument transformers is indispensable for an accurate simulation of the electromagnetic interference from primary system to the secondary system caused by very fast transients through potential and current transformer (PT/CT) in gas insulated substations. A systematic methodology is described for establishing the wide frequency circuit model of PTs based on wideband scattering parameter measurements in this paper. The new passive circuit model is only composed of R, L and C elements and ideal transformers, and the parameters of the elements can be easily calculated by the poles and residues of the PT short circuit admittance function. The circuit model is simple and robust. The simulation and measured results are presented, confirming the validity of the model and the systematic methodology proposed in this paper.
  • Keywords
    electromagnetic compatibility; electromagnetic interference; power transformers; current transformer; electromagnetic interference; gas insulated substations; instrument transformers; passive circuit model; potential transformer; transformers modeling; transient simulation; wide frequency circuit models; wideband scattering parameter measurements; Circuit simulation; Current transformers; Electromagnetic measurements; Electromagnetic modeling; Electromagnetic transients; Frequency; Instrument transformers; Scattering parameters; Voltage transformers; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Machines and Systems, 2008. ICEMS 2008. International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-3826-6
  • Electronic_ISBN
    978-7-5062-9221-4
  • Type

    conf

  • Filename
    4771495