Dual Mach-Zehnder Based Integrated X-Type Ratiometric Wavelength Monitor on Glass

Author

Bing Yang ; Weicheng Shi ; Chongyang Pei ; Hui Yu ; Xiaoqing Jiang ; Yinlei Hao ; Yubo Li ; Jianyi Yang

Author_Institution

Dept. of Inf. Sci. & Electron. Eng., Zhejiang Univ., Hangzhou, China

Volume

26

Issue

5

fYear

2014

fDate

1-Mar-14

Firstpage

433

Lastpage

436

Abstract

We design and fabricate an integrated ratiometric wavelength monitor based on ion-exchange waveguides on glass. The device consists of two unbalanced Mach-Zehnder interferometers acting as edge filters. They are designed to have X-type spectral response. Their output ratio is monotonic to the wavelength in the functional range of the wavelength monitor. The measured resolution is ~ 0.1 nm ranging from 1522 to 1576 nm, which can potentially be improved to 15 pm after packaged. The polarization dependency of the device is also discussed. Our work makes it possible to build a high performance integrated sensing and detecting optical system on one single chip.

Keywords

Mach-Zehnder interferometers; integrated optics; light polarisation; optical design techniques; optical fabrication; optical glass; optical sensors; optical waveguides; X-type spectral response; dual Mach-Zehnder based integrated X-type ratiometric wavelength monitor; edge filters; glass; high performance integrated sensing; ion-exchange waveguides; optical system; polarization dependency; single chip; unbalanced Mach-Zehnder interferometers; wavelength 1522 nm to 1576 nm; Monitoring; Optical fibers; Optical filters; Optical sensors; Wavelength measurement; Mach–Zehnder interferometer; X-type spectral response; integrated optics; ion-exchange; ratiometric wavelength monitor;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/LPT.2013.2295100

Filename

6702417