DocumentCode
483910
Title
Integration of Magnitude and Shape Related Features in Hyperspectral Mixture Analysis to Monitor Weeds In Citrus Orchards
Author
Somers, B. ; Delalieux, S. ; Verstraeten, W.W. ; Cools, K. ; Lhermitte, S. ; Coppin, P. ; Verbesselt, J.
Author_Institution
Dept. of Biosystems, Katholieke Univ. Leuven, Leuven
Volume
1
fYear
2008
fDate
7-11 July 2008
Abstract
Traditionally, Spectral Mixture Analysis (SMA) fails to fully account for highly similar ground components or endmembers. The high similarity between weed and crop spectra therefore hampers the implementation of SMA for steering weed control management practices. To address this problem, the current study presents an alternative SMA technique, referred to as Integrated Spectral Mixture Analysis (iSMA). iSMA combines both magnitude (~reflectance) and shape (~derivatives) related features in an automated waveband selection protocol and allows for an optimal separation between weed and crops, irrespective of the scenario considered. Compared to traditional approaches iSMA significantly improved weed cover fraction estimations (~17% increase). Analysis was performed on different simulated mixed pixel spectra sets compiled from in situ measured weed, Citrus canopy and soil spectra.
Keywords
crops; geophysical techniques; image processing; soil; spectra; vegetation mapping; Citrus canopy; Citrus reticulata; Citrus sinensis; Integrated Spectral Mixture Analysis; automated waveband selection protocol; citrus orchards weeds monitoring; control management practices; crop spectra; ground component spectra; hyperspectral mixture analysis; in situ measured weed; soil spectra; weed cover fraction estimations; Automatic control; Condition monitoring; Crops; Failure analysis; Performance analysis; Performance evaluation; Protocols; Reflectivity; Shape; Spectral analysis; Spectral Mixture Analysis; derivatives; hyperspectral; stable feature selection; weighted least squares;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2008. IGARSS 2008. IEEE International
Conference_Location
Boston, MA
Print_ISBN
978-1-4244-2807-6
Electronic_ISBN
978-1-4244-2808-3
Type
conf
DOI
10.1109/IGARSS.2008.4778857
Filename
4778857
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