• DocumentCode
    492102
  • Title

    Image Reconstruction Using OS-EM Method in Cone-beam CT

  • Author

    Dong, Baoyu

  • Author_Institution
    Sch. of Electr. & Inf., Dalian Jiaotong Univ., Dalian
  • fYear
    2008
  • fDate
    21-22 Dec. 2008
  • Firstpage
    108
  • Lastpage
    111
  • Abstract
    Traditional CT reconstructions are limited by many kinds of artifacts, and they give dissatisfactory image. To reduce image noise and artifacts, we propose a statistical iterative method for image reconstruction in cone-beam CT. First the theory of maximum likelihood estimation (MLE) is extended from emission CT to X-ray scan, then an expectation-maximization (EM) formula is deduced for direct reconstruction of cone-beam CT. EM algorithm is an iterative method that can produce good quality reconstruction, but compared with fast and robust FDK algorithm, EM algorithm is computer intensive and convergence slow. In order to accelerate the convergence speed of EM algorithm, ordered subset (OS) is applied in Cone-beam CT. Experimental results with computer simulated data and real CT data show that OS-EM algorithm can provide good quality reconstructions after only a few iterations. In addition, the point spread function of the OS-EM algorithm is analyzed for evaluating the imaging system performance.
  • Keywords
    X-ray microscopy; computerised tomography; expectation-maximisation algorithm; image reconstruction; iterative methods; medical image processing; optical transfer function; set theory; OS-EM method; X-ray scan; computed tomography; cone-beam CT; expectation-maximization formula; image reconstruction; maximum likelihood estimation; ordered subset; point spread function; statistical iterative method; Acceleration; Computed tomography; Convergence; Image reconstruction; Iterative algorithms; Iterative methods; Maximum likelihood estimation; Noise reduction; Robustness; X-ray imaging; Cone-beam CT; Image reconstruction; MLE; OS-EM algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Knowledge Acquisition and Modeling Workshop, 2008. KAM Workshop 2008. IEEE International Symposium on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-3530-2
  • Electronic_ISBN
    978-1-4244-3531-9
  • Type

    conf

  • DOI
    10.1109/KAMW.2008.4810436
  • Filename
    4810436