DocumentCode
500867
Title
Online cache state dumping for processor debug
Author
Vishnoi, Anant ; Panda, Preeti Ranjan ; Balakrishnan, M.
Author_Institution
Dept. of Comput. Sci. & Eng., Indian Inst. of Technol. Delhi, New Delhi, India
fYear
2009
fDate
26-31 July 2009
Firstpage
358
Lastpage
363
Abstract
Post-silicon processor debugging is frequently carried out in a loop consisting of several iterations of the following two key steps: (i) processor execution for some duration, followed by (ii) dumping out of the processor´s internal state into an external logic analyzer for further offline processing. Internal state of the processor is dominated by the L2 cache. During the process of dumping the cache content, the processor´s execution is halted so that the state can be faithfully reproduced offline. In order to reduce the duration for which the processor is halted, and indirectly reduce debug time, we propose two online cache dumping strategies, retransmit non-dumped line (RNL) and dump history table (DHT), with the objective of transferring the cache contents while the processor is executing, and yet maintaining fidelity of the dumped data. For typical experimental debug scenarios, we observe that the effective dump times are reduced to between 0.01% and 3.5% of the original times. We also employ compression to reduce the cache content transfer time and logic analyzer space. Our experiments indicate an average compression ratio of 59.2%.
Keywords
cache storage; data compression; logic testing; microprocessor chips; L2 cache; data compression; dump history table; external logic analyzer; offline processing; online cache state dumping; post-silicon processor debugging; processor execution; retransmit nondumped line; Circuit testing; Computer science; DH-HEMTs; Debugging; History; Integrated circuit reliability; Integrated circuit testing; Logic design; Logic testing; Permission; Cache Compression; Design for Debug; Post-silicon Validation; Processor Debug; Silicon Debug;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-6055-8497-3
Type
conf
Filename
5227124
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