DocumentCode
500913
Title
Clock skew optimization via wiresizing for timing sign-off covering all process corners
Author
Onaissi, Sari ; Heloue, Khaled R. ; Najm, Farid N.
Author_Institution
Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
fYear
2009
fDate
26-31 July 2009
Firstpage
196
Lastpage
201
Abstract
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, variability in clock networks is either handled early in the design flow by assigning margins to clock network delays, or at a later stage through post-processing steps that only focus on achieving minimal skew, without regard to functional block variability. In this work, we present a technique that alters clock network lines so that the circuit meets its timing constraints at all process corners. This is done near the end of the design flow while considering delay variability in both the clock network and the functional blocks. Our method operates at the physical level and provides designers with the required changes in clock network line widths and/or lengths. This can be formulated as a linear programming (LP) problem, and thus can be solved efficiently. Empirical results for a set of ISCAS-89 benchmark circuits show that our approach can considerably reduce the effect of process variations on circuit performance.
Keywords
clocks; delays; linear programming; logic circuits; logic design; ISCAS-89 benchmark circuits; clock network delays; clock networks; clock skew optimization; functional block delays; linear programming problem; manufacturing process variability; synchronous logic circuits performance; Circuit optimization; Clocks; Delay effects; Hardware; Integrated circuit reliability; Linear programming; Logic circuits; Manufacturing processes; Timing; Wire; Clock skew optimization; parameterized timing analysis; sign-off; variability; wiresizing;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
Conference_Location
San Francisco, CA
ISSN
0738-100X
Print_ISBN
978-1-6055-8497-3
Type
conf
Filename
5227171
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