• DocumentCode
    500913
  • Title

    Clock skew optimization via wiresizing for timing sign-off covering all process corners

  • Author

    Onaissi, Sari ; Heloue, Khaled R. ; Najm, Farid N.

  • Author_Institution
    Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Firstpage
    196
  • Lastpage
    201
  • Abstract
    Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, variability in clock networks is either handled early in the design flow by assigning margins to clock network delays, or at a later stage through post-processing steps that only focus on achieving minimal skew, without regard to functional block variability. In this work, we present a technique that alters clock network lines so that the circuit meets its timing constraints at all process corners. This is done near the end of the design flow while considering delay variability in both the clock network and the functional blocks. Our method operates at the physical level and provides designers with the required changes in clock network line widths and/or lengths. This can be formulated as a linear programming (LP) problem, and thus can be solved efficiently. Empirical results for a set of ISCAS-89 benchmark circuits show that our approach can considerably reduce the effect of process variations on circuit performance.
  • Keywords
    clocks; delays; linear programming; logic circuits; logic design; ISCAS-89 benchmark circuits; clock network delays; clock networks; clock skew optimization; functional block delays; linear programming problem; manufacturing process variability; synchronous logic circuits performance; Circuit optimization; Clocks; Delay effects; Hardware; Integrated circuit reliability; Linear programming; Logic circuits; Manufacturing processes; Timing; Wire; Clock skew optimization; parameterized timing analysis; sign-off; variability; wiresizing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227171