• DocumentCode
    500954
  • Title

    Circuit techniques for dynamic variation tolerance

  • Author

    Bowman, Keith ; Tschanz, James ; Wilkerson, Chris ; Lu, Shih-Lien ; Karnik, Tanay ; De, Vivek ; Borkar, Shekhar

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    2009
  • fDate
    26-31 July 2009
  • Firstpage
    4
  • Lastpage
    7
  • Abstract
    Three circuit techniques for dynamic variation tolerance are presented: (i) Sensors with adaptive voltage and frequency circuits, (ii) Tunable replica circuits for timing-error prediction with error recovery, and (iii) Embedded error-detection sequential circuits with error recovery. These circuits mitigate the clock frequency guardbands for dynamic variations, thus improving microprocessor performance and energy-efficiency. These circuits are described with a focus on the different trade-offs in guardband reduction and design overhead. Opportunities for CAD to further enhance microprocessor performance and energy efficiency are offered.
  • Keywords
    CAD; microprocessor chips; sequential circuits; system recovery; CAD; adaptive voltage; circuit techniques; clock frequency guardbands mitigation; design overhead; dynamic variation tolerance; energy efficiency; error recovery; error-detection sequential circuits; frequency circuits; microprocessor performance; sensors; timing-error prediction; Aging; Circuits; Degradation; Delay; Energy efficiency; Error correction; Frequency; Microprocessors; Permission; Temperature; Dynamic variations; error correction; error detection; error recovery; error-detection sequential; parameter variations; replica paths; resilient circuits; timing errors; variation sensors; variation-tolerant circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2009. DAC '09. 46th ACM/IEEE
  • Conference_Location
    San Francisco, CA
  • ISSN
    0738-100X
  • Print_ISBN
    978-1-6055-8497-3
  • Type

    conf

  • Filename
    5227213