DocumentCode
501872
Title
Comparison of solutions to minimize voltages induced by ESD events on adjacent microstrips
Author
Harris, Jay
Author_Institution
Littelfuse, Inc., Des Plaines, IL, USA
fYear
2001
fDate
11-13 Sept. 2001
Firstpage
388
Lastpage
395
Abstract
This paper discusses the effects of ESD pulsed microstrip lines on adjacent lines. Even though a line may be insensitive to ESD events, voltages can couple to adjacent, sensitive lines. These induced voltages may result in temporary of permanent system malfunction. Five different solutions to this problem will be discussed.
Keywords
electrostatic discharge; microstrip lines; ESD pulsed microstrip line; adjacent microstrips; electrostatic discharge; voltage induction; Coupling circuits; Crosstalk; Current density; Electrostatic discharge; Microstrip; Power system protection; Printed circuits; Road transportation; Varistors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location
Portland, OR
Print_ISBN
978-1-5853-7039-9
Electronic_ISBN
978-1-5853-7039-9
Type
conf
Filename
5254943
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