DocumentCode
501905
Title
An effective ESD protection system in the Back end (BE) semiconductor manufacturing facility
Author
Yan, K.-P. ; Gaertner, Reinhold ; Lim, Seng
Author_Institution
Infineon Technol. (Malaysia) Sdn. Bhd., Batu Berendam, Malaysia
fYear
2001
fDate
11-13 Sept. 2001
Firstpage
124
Lastpage
131
Abstract
ESD protection measures in the Back-end (BE) semiconductor manufacturing environment have become more and more critical. This is due to the increased sensitivity to ESD damage of microchips from the decreasing structural geometries and increased integration density. However, the requirements for BE ESD protection have not been well understood in the semiconductor industry. Some of the commonly observed evidence of this are overkill ESD protection measures with ineffective end results. This paper provides an overview on an effective ESD protection system implementation in a BE semiconductor manufacturing facility.
Keywords
electrostatic discharge; protection; radiation hardening (electronics); semiconductor device manufacture; BE semiconductor manufacturing facility; back end semiconductor manufacturing environment; effective ESD protection system; integration density; microchips; Bonding; Electrostatic discharge; Footwear; Humans; Lead compounds; Personnel; Production facilities; Protection; Wire; Wrist;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Overstress/Electrostatic Discharge Symposium, 2001. EOS/ESD '01.
Conference_Location
Portland, OR
Print_ISBN
978-1-5853-7039-9
Electronic_ISBN
978-1-5853-7039-9
Type
conf
Filename
5254978
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