DocumentCode
502694
Title
High Holding Current SCRs (HHI-SCR) for ESD protection and latch-up immune IC operation
Author
Mergens, Markus P J ; Russ, Christian C. ; Verhaege, Koen G. ; Armer, John ; Jozwiak, Phillip C. ; Mohn, Russ
Author_Institution
Sarnoff Corporation, 201 Washington Road, Princeton, NJ-08543, USA
fYear
2002
fDate
6-10 Oct. 2002
Firstpage
10
Lastpage
17
Abstract
This paper presents a novel SCR for power line and local I/O ESD protection. The HHI-SCR exhibits a dual ESD clamp characteristic: low-current high-voltage clamping and high-current low-voltage clamping. These operation modes enable latch-up immune normal operation as well as superior full chip ESD protection. The minimum latch current is controlled by device design. The HHI-SCR is demonstrated in 0.10um-CMOS and in a 0.4um-BiCMOS technology. The design is highly area efficient.
Keywords
Anodes; Breakdown voltage; Circuits; Clamps; Dynamic voltage scaling; Electrostatic discharge; Europe; MOS devices; Protection; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
2002 Electrical Overstress/Electrostatic Discharge Symposium, 2002. EOS/ESD '02.
Conference_Location
Charlotte, NC, USA
Print_ISBN
978-1-5853-7040-5
Electronic_ISBN
978-1-5853-7040-5
Type
conf
Filename
5267044
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