Electron probe micro-area image fusion based on second generation bandelet transform

Aimed at the characteristics of the sample secondary electron and backscattered electron image as well as current image, this paper proposes a new image fusion algorithm based on second generation bandelet transform. Firstly, the bandelet transform can take advantage of the geometrical regularity of image structure, so we composite the images by bandelet transform, combining with the variety characteristics of micro-area image that the electron microprobe has acquired. Then, according to the characteristics of high and low frequency coefficient, the low frequency part uses energy average to summarize, while high frequency part uses similarity fitting fusion to process. Finally, reconstruct the fusion information to get EPMA fusion image that has large information quality. The simulation experiment of the EPMA image shows that, image fusion can better reflect the various types of the single-image information, the effect of the fusion is higher than the ordinary wavelet fusion, and has a practical application value in the comprehensive analysis of the EPMA micro-area images.